Pulse testing is a measurement technique that reduces the total energy consumption of a device. It avoids possible damage to small nanodevices by reducing Joule heating effects such as I2R and V2/R. The pulse test uses a sufficiently high power supply to apply a very short pulse to the device under test (DUT) to produce a high quality measurable signal and then remove the source.

Through pulse testing, engineers can obtain more device information and more accurately analyze and master the behavioral characteristics of the device. For example, pulse testing techniques can be used to perform transient testing of nanodevices to determine their transfer function to analyze the characteristics of the material being tested. Pulse test measurements are also necessary for devices with constant temperature limits, such as SOI devices, FinFETs, and nanodevices, which avoid self-heating effects and prevent self-heating effects from masking the response characteristics of interest to researchers. Device engineers can also use pulse testing techniques to analyze charge trapping effects. The charge trapping effect reduces the drain current after the transistor is turned on. As the charge is gradually trapped into the gate dielectric, the threshold voltage of the transistor increases due to the built-in voltage of the gate capacitance; thus the drain current is reduced.

Pulse testers provide an important means for people and research in nanomaterials, nanoelectronics, and current semiconductor devices.

There are two different types of pulse tests: a voltage pulse and a current pulse.

The voltage pulse test produces a pulse width that is much narrower than the current pulse test. This feature makes the voltage pulse test more suitable for heat transfer experiments, where the time window we care about is only a few hundred nanoseconds. The amount of energy consumed on the nanodevices can be controlled by high precision amplitudes and programmable rise and fall times. Voltage pulse testing can be used for transient analysis, charge trapping, and AC stress testing in reliability testing, as well as for generating clock signals and simulating repetitive control lines, such as memory read and write cycles.

The current pulse test is very similar to the voltage pulse test. Among them, the specified current pulse is loaded onto the DUT, and then the voltage generated across the device is measured. Current pulse testing is often used to measure lower resistance or to acquire the IV characteristic curve of the device without causing the DUT to generate significant amounts of energy and avoid damage or damage to the nanodevice.

Pulse: The waveform of voltage (V) or current (A) is like the waveform of pulse beat on the electrocardiogram, but what power pulse, sound pulse is heard now... What is the explanation? The original meaning of the pulse is extended: A mechanical form such as a wave that is emitted at the same time, academically defines a pulse as a pulse that is abruptly changed in a short time and then quickly returns to its initial value.

Pulse signal: A sudden change in voltage, a voltage or current with a very short duration of action is called a pulse signal. It can be repeated periodically, or it can be aperiodic or single. A pulse signal is a discrete signal with various shapes. Compared with a normal analog signal (such as a sine wave), the waveform is discontinuous in the time axis (the waveform is clearly spaced from the waveform) but has a certain periodicity. It is its characteristics. The most common pulse wave is a rectangular wave (that is, a square wave). The pulse signal can be used to represent information, and can also be used as a carrier wave, such as pulse code modulation (PCM), pulse width modulation (PWM), etc. in pulse modulation, and can also be used as a clock signal for various digital circuits and high performance chips. . The so-called pulse signal is represented by a curve with infinite number of breakpoints in the plane coordinate. That is to say, there are no limit points in some places in the periodicity, such as sawtooth wave, and the signal of the digital circuit used in the computer, 0,1 . Pulse signal, that is, a signal like pulse beat, relative to DC, intermittent signal, if the flow of water is described, DC is to open the faucet all the way to the water, the pulse is the non-stop switch faucet to form a water pulse. You turn on the light and turn it on. This is DC. When you turn the switch light on and off, a pulse is formed. The speed of the switch is the pulse frequency.

Pulse power supply: The user's load needs to be intermittently powered. That is, according to a certain time rule, the load is energized for a certain period of time, and then the power is turned off for a certain period of time. Repeatedly, the pulse power supply is constructed. For example, in the sophisticated process of a non-polar electrolytic capacitor, it is necessary to charge the capacitor for a period of time, then discharge, and then charge the capacitor for a period of time, then discharge, thus forming a positive → discharge (power off) → reverse → Discharge → forward..., so repeated.

Pulse width: It is the time that the high level lasts. It is often used as a trigger signal for components such as sampling signals or thyristors.

Pulse circuit: It is the circuit that generates, shapes and transforms the pulse waveform. The pulse circuit consists of two parts: an inert circuit and a switch. The function of the switch is to destroy the steady state and make the circuit transient.

Pulse dialing: is a time domain processing method that uses the number of pulses to represent the number. The pulse dialing method has strict requirements on the width, size, spacing and shape of the pulse. If these parameters are changed due to interference of the line or other reasons, the number receiving error may be caused. On the other hand, since each pulse occupies a certain time (generally, each pulse takes 100 ms), this dialing method is relatively slow.

Pulse heating: It uses a variety of waveform pulse currents to heat up in a timely manner to achieve some special process requirements.

Pulse wave: It is the signal waveform generated in the form of impact.

Both voltage and current pulse tests have many advantages, but their disadvantages are not the same. For example, velocity characterization of ultrashort voltage pulses is a matter of radio frequency (RF), so if the test system is not optimized for high bandwidth, errors can easily occur during the measurement process. There are three main sources of error: signal loss due to cables and connectors, losses due to device parasitics, and contact resistance.

The main problem with current pulse testing is that the rise time is slow and can be as long as several hundred nanoseconds. This is mainly limited by the inductance and capacitance in the experimental configuration.